Professor Subhasish Mitra directs the Robust Systems Group in the Department of Electrical Engineering and the Department of Computer Science of Stanford University, where he is the Chambers Faculty Scholar of Engineering. Prior to joining Stanford, he was a Principal Engineer at Intel Corporation.

Prof. Mitra's research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies.  His X-Compact technique for test compression has been key to cost-effective manufacturing and high-quality testing of a vast majority of electronic systems, including numerous Intel products. X-Compact and its derivatives have been implemented in widely-used commercial Electronic Design Automation tools. The QED and IFRA techniques, created jointly with his students, have shown outstanding results in overcoming critical bottlenecks in post-silicon validation and debug for several commercial hardware platforms, and have been characterized as "breakthrough" in a Research Highlight in the Communications of the ACM. His work on carbon nanotube imperfection-immune digital VLSI, jointly with his students and collaborators, resulted in the demonstration of the first carbon nanotube computer, and it was featured on the cover of NATURE. The National Science Foundation presented this work as a Research Highlight to the United States Congress, and it also was highlighted as "an important, scientific breakthrough" by the BBC, Economist, EE Times, IEEE Spectrum, MIT Technology Review, National Public Radio, New York Times, Scientific American, Time, Wall Street Journal, Washington Post, and numerous other organizations worldwide.

Prof. Mitra's honors include the Presidential Early Career Award for Scientists and Engineers from the White House, the highest United States honor for early-career outstanding scientists and engineers, IEEE CAS/CEDA Pederson Award, and the Intel Achievement Award, Intel’s highest corporate honor.  He and his students published several award-winning papers at major venues: IEEE/ACM Design Automation Conference, IEEE International Solid-State Circuits Conference, IEEE International Test Conference, IEEE Transactions on CAD, IEEE VLSI Test Symposium, Intel Design and Test Technology Conference, and the Symposium on VLSI Technology. At Stanford, he has been honored several times by graduating seniors "for being important to them during their time at Stanford."

Prof. Mitra has served on numerous conference committees and journal editorial boards. Recently, he served on DARPA's Information Science and Technology Board as an invited member. He is a Fellow of the IEEE.