Anna Duque Antón, a research associate at the Chair of Electronic Design Automation (Prof. Kunz), has received the Edward J. McCluskey Best Doctoral Thesis Award from the IEEE Test Technology Technical Community (TTTC) at the International Test Conference (ITC) 2026 in San Antonio, Texas, USA. The award recognizes her dissertation, "From Threat Models to Scalable Methodologies for Formal Hardware Security Analysis." 

Candidates from around the world first present their work at IEEE conferences sponsored by the TTTC in North America, Latin America, Asia and Europe (VTS, LATS, ATS and ETS). The finalists from each of these conferences are then invited to the ITC in the USA, where a jury of industry representatives selects the winner.

Our doctoral researcher Anna Duque Anton has won the 2026 European Test Symposium semi-final of the TTTC E. J. McCluskey Best Doctoral Thesis Award. She will participate in the final at the International Test Conference in October.