Contact
Email: zhangzhe(at)rhrk.uni-kl.de
Publications
Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22nm FDSOI Latches
Z. Zhang, C. Weis, N. Wehn, M. Tahoori, S. Nassif. IEEE International Symposium on On-Line Testing and Robust System Design, July 2024.
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
Z. Zhang, M. Mayahinia, C. Weis, N. Wehn, M. Tahoori, S. Nassif, G. Tshagharyan, G. Harutyunyan, Y. Zorian. IEEE VLSI Test Symposium, April, 2024, Tempe, AZ, USA.
Machine learning based soft error rate estimation of pass transistor logic in high-speed communication
Z. Zhang, J. Lappas, A. Chinazzo, C. Weis, Z. Wu, L. Ni, N. Wehn, M. Tahoori. 27th IEEE European Test Symposium, May, 2022, Barcelona, Spain.