Contact
Email: zhangzhe(at)rhrk.uni-kl.de
Publications
Addressing the Combined Effect of Transistor and Interconnect Aging in SRAM towards Silicon Lifecycle Management
Z. Zhang, M. Mayahinia, C. Weis, N. Wehn, M. Tahoori, S. Nassif, G. Tshagharyan, G. Harutyunyan, Y. Zorian. IEEE VLSI Test Symposium, April, 2024, Tempe, AZ, USA.
Machine learning based soft error rate estimation of pass transistor logic in high-speed communication
Z. Zhang, J. Lappas, A. Chinazzo, C. Weis, Z. Wu, L. Ni, N. Wehn, M. Tahoori. 27th IEEE European Test Symposium, May, 2022, Barcelona, Spain.