Towards Sustainable Textile Electronics
B. Zhou, M. Liu, S. Bian, D. Geißler, P. Lukowicz, J. Miranda, J. Dan, D. Atienza, M. A. Riahi, N. Wehn, R. Torah, S. Yong, J. Liu, S. Beeby, M. Kohler, B. Greinke, J. Yu, V. Nierstrasz, L. Sheldrick, R. Stewart, T. Nieri, M. Maccanti, D. Spinelli. Accepted for Publication,  IEEE Conference Design, Automation and Test in Europe (DATE),  March, 2025, Lyon, France.

Timing Analysis beyond Complementary CMOS Logic Styles
J. Lappas, A. Riahi, C. Weis, N. Wehn, S. Nassif. 29th Asia and South Pacific Design Automation Conference (ASP-DAC), Januar, 2024, Incheon Songdo , South Korea