DFI Performance Monitor for LPDDR4X in 12 nm FinFET
J. Feldmann, L. Steiner, C. Weis, N. Wehn. Accepted for Publication, 22nd International SoC Design Conference (ISOCC 2025), October, 2025, Busan, Korea.

Integrated Sensor System for Rotary Shaft Seals Enabling Condition Monitoring of Dynamic Sealing Contact and Lubricant
Y. Stiemcke, C. Rheinländer, J. Feldmann, J. Uebel, T. Becker, K. Nikolaus, J. Seewig, N. Wehn, O. Koch, B. Sauer, S. Thielen. Accepted for Publication, Engineering Research - Forschung im Ingenieurwesen, 2025

Low-power, Energy-efficient, Cardiologist-level Atrial Fibrillation Detection for Wearable Devices
D. Loroch, J. Feldmann, V. Rybalkin, N. Wehn. Accepted for Publication, 2025 IEEE 38th International System-on-Chip Conference (SOCC),  Sep. 29 - Oct. 1, 2025, Dubai, U.A.E.

A 4.266 Gbps/pin LPDDR4X PHY with an Integrated RISC-V Subsystem Optimized for Large Bump Pitch in 12nm FinFET Technology
M. Mestice, J. Feldmann, J. Lappas, M. Esmaeilpour, C. Weis, N. Wehn. Accepted for Publication, 2025 IEEE 38th International System-on-Chip Conference (SOCC),  Sep. 29 - Oct. 1, 2025, Dubai, U.A.E.

Enhanced LPDDR4X PHY in 12 nm FinFET
J. Feldmann, J. Lappas, M. Esmaeilpour, H. Abdo, C. Weis, N. Wehn. RISC-V Summit Europe, June, 2024, Munich, Germany.
Link

A Precise Measurement Platform for LPDDR4 Memories
J. Feldmann, L. Steiner, D. Christ, T. Psota, M. Jung, N. Wehn. ACM International Symposium on Memory Systems (MEMSYS 2023), Oktober, 2023, Alexandria, VA, USA

Code-based Cryptography in IoT: A HW/SW Co-Design of HQC
M. Schöffel,J. Feldmann, N. Wehn. IEEE World Forum on Internet of Things, November, 2022, Yokohama, Japan.
Best Paper Award

Efficient Generation of Application Specific Memory Controllers
M. V. Natale, M. Jung, K. Kraft, F. Lauer, J. Feldmann, C. Sudarshan, C. Weis, S. O. Krumke, N. Wehn. ACM/IEEE International Symposium on Memory Systems (MEMSYS 2020), October, 2020, virtual conference.

A 22nm ASIC for Flexible Post-Quantum Cryptography
P. Karl, J. Schupp, D. Basu-Roy, M. Schöffel, J. Feldmann, N. Wehn, G. Sigl. Workshop on Topics in hArdware SEcurity and RISC-V (TASER), September, 2022, Leuven, Belgium.

Fast and Accurate DRAM Simulation: Can we Further Accelerate it?
J. Feldmann, M. Jung, K. Kraft, L. Steiner, N. Wehn. IEEE Conference Design, Automation and Test in Europe (DATE), March, 2020, Grenoble, France.
Nominated for Best Paper Award

Fast Simulation of DRAMs with Neural Networks
M. Jung, J. Feldmann, M. M. Ghaffar, N. Wehn. Talk at the 1st ACM/IEEE Workshop on Machine Learning for CAD (MLCAD), September, 2019, Canmore, Alberta, Canada.